A High-Throughput Optical Microscopy Approach to Correlate the Surface Topography of Materials and Their Energy Conversion Properties

An approach to combine functional data with structural data for a wide range of materials. Particularly useful for ultrathin nanosystems such as 2D transition metal dichalcogenides (MoS2) and perovskite  photovoltaics. The method incorporates novel software as well as hardware modifications.


Available for Licensing

IP Status

US Utility Patent Pending


Justin Sambur
Li Wang

At A Glance
  • Overlays structural (e.g., electron, scanning probe, or optical microscopy images) and functional images (e.g., PL, Raman, Photocurrent images).
  • Quantitative / seamless process
  • Useful for a variety of industries
Licensing Director

Mandana Ashouri

Reference No.:  19-045


Many industries and research domains measure functional signals (Ex:  light emission, photo-induced current) using focused laser beams. No technique exists to date to overlay those images with topographical data seamlessly and quantitatively.

Technology Overview

Novel algorithms along with hardware modifications to the microscopic / spectroscopic apparatus allows for the collection and processing of reflected laser signal. The captured signal is used to create a topographical map (C) of the sample. That map is then seamlessly overlaid onto the functional data image (B) to create a composite image (D).

  • Fast, efficient screening of materials
  • Simple modification to existing designs
  • Allows for easy to see structure-function relationships

Wang, L.; Sambur, J.B.; “Efficient Ultrathin Liquid Junction Photovoltaics Based on Transition Metal Dichalcogenides” Nano Letters, 2019, 19 (5), 2960–2967.

Last updated: December 2019

Add keywords or various names of inventors here (text is hidden)