System and Method for Direct Particle Sampling from Air
A new system that directly measures airborne nanoparticles with enhanced sensitivity to a broader range of particle sizes
Opportunity
Available for Licensing
TRL: 5
IP Status
US Utility Patent Pending: US 2019/0250076 A1
Inventor
Su-Jung (Candace) Tsai
At A Glance
Researchers at Colorado State University have produced just the device that improves upon the current state of the art. The nanoparticle measurement device has enhanced sensitivity to a broader range of particle sizes. It also directly measures airborne nanoparticles, improving on the current indirect methods in which particles are lost due to the necessity of multiple devices. On top of that, it is smaller and easier to handle than current technologies. All of these improvements make this novel device a must-have for worker safety in this developing industry.
Background
The nanotechnology industry is rapidly growing, expanding into markets that many people don’t realize. Nanomaterials are being utilized in sunscreen, clothing, biotech, and weapon production, to name a few. With the rapid expansion of this industry, medical concerns for employees must be quickly addressed. OSHA has stated that over-exposure to airborne nanoparticles can have detrimental effects, including tissue damage and cancer. To protect employees, devices have been produced to sample nanoparticles and identify potential risk areas. However, these devices are laborious, being large, inefficient, and slow. Novel particle detection tools are needed to address risks to employees in this rapidly emerging market.
Benefits and Advantages
- Device directly measures airborne nanoparticles preventing harmful exposure for employees that produce nanomaterials
- Current nanoparticle measuring devices are large, inefficient, and regularly miss detection of detrimental particles
- The rapid growth of the nanotechnology industry requires careful protection of employees who risk exposure to harmful nanoparticles
Last updated: April 2020